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Encyclopedia of materials characterization : surfaces, interfaces, thin films / edited by C. Richard Brundle, Charles A. Evans [and] Shaun Wilson. - Boston : Butterworth-Heinemann, 1992. - 751p. : ill.; 24cm.

Includes bibliographical references Includes index

0750691689


Surfaces(technology)--Testing

TA418.7 / B73 1992
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