000 01012nam a2200277 4500
001 0000001846
003 0
008 100521s1998####nyu###########001#0#eng##
020 _a0827371268
040 _aPSP
_cPSP
090 _aT50
_bB8 1998
100 1 _aBusch, Ted
245 1 0 _aFundamentals of dimensional metrology /
_cTed Busch, Roger Harlow, Richard Thompson
250 _a3rd.ed.
260 _aAlbany
_bDelmar Publisher,
_cc1998.
300 _axii, 624 p.:
_bill.;
_c24 cm.
500 _aIncludes index
650 0 _aMeasuring instruments
650 0 _aMensuration
700 1 _aHarlow, Roger
700 1 _aThompson, Richard
942 _cBK
_2lcc
952 _p0000020866
_40
_00
_6T_00050_B8_1998
_910652
_bPSP
_10
_oT50.B8 1998
_d2010-06-15
_70
_cREF
_2lcc
_yBK
_aPSP
952 _70
_p0000020867
_cOS
_40
_00
_2lcc
_910653
_bPSP
_yBK
_10
_d2010-06-15
_aPSP
952 _w2010-06-15
_p0000020868
_r2010-10-07
_40
_00
_910654
_bPSP
_10
_d2010-06-15
_70
_cOS
_2lcc
_yBK
_s2010-09-20
_l1
_aPSP
999 _c1756
_d1756